An AFM is an exceptional tool for measuring grain structure on surfaces. This is because the AFM has great contrast on flat samples. The analysis of AFM images of grains is advantageous because the images have three dimensional topography and the grain boundaries can be easily identified. Figure 5-12 illustrates the use of software for identifying grains of polysilicon.
After the grains are identified with software, the volume, size, area, etc., can be calculated and displayed in a tabular or graphical format.
FIGURE 5-12 Grains may be identified with thresholding software. Analysis of grains is very similar to the analysis of particles
5.3.6 Technical Samples
An AFM is helpful with product development and quality control of many high technology products such as DVDs. Software is available for automatically analyzing such samples (see Figure 5-13).
FIGURE 5-13 Using thresholding software, analysis of technical samples such as DVD bits can be automated.
