AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2


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FIGURE 2-8 Left: A piezoelectric cylinder has electrodes on the inside and outside so that the potential goes through the wall of the ceramic. When activated the cylinder elongates. Right: A piezoelectric bimorph has two sheet of piezoelectric material bonded together. The end of the bimorph expands in a parabolic motion when activated.
FIGURE 2-9 Top: PZT materials have hysteresis. When a voltage ramp is placed on the ceramic, the motion is nonlinear. Bottom: Creep occurs when a voltage pulse on a PZT causes initial motion followed by drift.
Ideally, the piezoelectric ceramics would expand and contract in direct proportion to the driving voltage. However, piezoelectric materials have two primary non-ideal behaviors, hysteresis and creep. Hysteresis, derived from the word history, causes the ceramic to maintain the shape that it was in. As the ceramic is expanding, there is a negative shaped non-linearity, and as the material is contracting, there is a positive shaped non-linearity. Creep occurs when the ceramic is subjected to a sudden impulse such as a voltage step function. These non-ideal behaviors must be corrected or they cause distortions in AFM images.

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