AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2


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FIGURE 2-43 Equations for calculating force constants with the Sader Method.
2.6 Miscellaneous Topics
There are many subjects associated with AFM instrumentation that do not fall under any of the traditional categories. These include the effect of vibrations on an AFM, scanning in controlled environments, and heating and cooling stages.
2.6.1 Vibrations
Vibrations that can degrade the resolution of AFM images can come from two sources:
a) Acoustic Vibrations that are transmitted through the air and have their source from fans, human voices, and other sound sources. Acoustic vibrations can be reduced by putting the AFM in a sealed box that is constructed from acoustic dampening materials.
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