AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2
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2.4 AFM Acquisition Software
Typically, a software interface is used for controlling the AFM stage. Functions controlled by software include setting all movement of the XY stage to locate the feature for scanning, probe approach to get the probe near/on the surface, and setting scan parameters, display of images while scanning, and a capability for measuring F/D curves. Figure 2-33 illustrates a typical AFM scan control window. Below is a list of the functions found in the control software.
FIGURE 2-33 A window such is this is typically used for acquiring AFM images. There is a section for: (1) displaying images; (2) entering scan parameters; and (3) displaying 2-D profiles.
Display
Visualizing the AFM image in real time is critical to the efficiency of the AFM. This allows an operator to assure that they are scanning the correct region of a sample, and facilitates optimizing the scan parameters such as scan rate and PID settings. Typically there are at least two types of display.
  • A 2-D representation of the image which shows the topography of the specimen being scanned. To correct for tilt between the probe and sample, the image is line leveled, (see Section 5.1.1). Without real time line leveling, the image will only show the tilt between the probe and sample.
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