AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2


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  • Generate scanning signals for the x-y piezo
  • Take an input signal from the force sensor and then generate control voltage for the Z piezo
  • Output control signals for X-Y-Z stepper motors
  • Generate signals for vibrating the probe and measuring phase or
    amplitude when vibrating mode is used for scanning
  • Collect signals for display by the computer
The following sections are a detailed description of these functions.
FIGURE 2-26 Block diagram of the functions in an AFM electronic controller as implemented with analog electronics.
As mentioned above, these functions may be implemented with either digital or analog electronics. In the digital approach, see Figure 2-27, all signals from the stage are digitized, and a DSP chip takes care of all of the feedback control calculations. Also, the DSP chip generates the x-y raster scan functions. The advantage of analog electronics is that they are typically less noisy. Because the functionality of a DSP chip is created by a software program, the DSP approach gives a little more flexibility and can be changed very rapidly.
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